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Home / Solutions / Semiconductor Chip testing solution

Semiconductor Chip testing solution

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Double-deck High and Low Temperature Test Chamber
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+86 180 0288 0096
sales@belltestchamber.com
He'an Avenue, Yuanzhou Town, Boluo County, Huizhou City, Guangdong Province, China
324 S DIAMOND BAR BLVD, UNIT NUM 717, DIAMOND BAR, CA, 91765-1607, UNITED STATES

About Bellue

About Bellue

Products

Environmental Chamber
Battery Test Chamber

New Energy testing solution
Defence and Military testing solution
Automotive Vehicle testing solution
Semiconductor Chip testing solution

New Energy testing solution
Defence and Military testing solution
Automotive Vehicle testing solution
Semiconductor Chip testing solution

IEC 62133
ECE R100
IEC 62619
UL 1642
UL 2580
UN 38.3

IEC 62133
ECE R100
IEC 62619
UL 1642
UL 2580
UN 38.3

Company News
Industry News
Media coverage
Branch Company Information

Company News
Industry News
Media coverage
Branch Company Information

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HOME
Environmental Chamber
Battery Test Chamber
SOLUTIONS
TEST STANDARDS
- IEC 62133
- ECE R100
- IEC 62619
- UL 1642
- UL 2580
- UN 38.3
NEWS
ABOUT
- About Bellue
CONTACT
- Message
- Contact Information

HOME
Environmental Chamber
Battery Test Chamber
SOLUTIONS
TEST STANDARDS
- IEC 62133
- ECE R100
- IEC 62619
- UL 1642
- UL 2580
- UN 38.3
NEWS
ABOUT
- About Bellue
CONTACT
- Message
- Contact Information